Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe ? a new state-of-the-art instrument ? is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.
Atom-Probe Tomography Ebook
The Local Electrode Atom Probe
By: Michael K. Miller; Richard G. Forbes
Publisher:
Springer
Print ISBN: 9781489974297, 1489974296
eText ISBN: 9781489974303, 148997430X
Copyright year: 2014
Format: PDF
Available from $ 149.00 USD
SKU: 9781489974303
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